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For the first time, both X-ray and neutron beams meet at the same sample volume enabling unprecedented investigations of nanomaterials using small angle scattering (SAS) techniques.  A portable small angle X-ray scattering (SAXS) instrument with a proper geometrical dimension was successfully design...

Real-time GIWAXS/GISAXS studies reveal details of the formation and post processing processes of active layers of bulk-heterojunction organic solar cells. In three recent publications deep insights into thin film structure formation is presented and the impact of GIWAXS and GISAXS methodologies for ...

In this workshop you will learn to interpret diffuse scattering and to simulate disordered crystal structures. Defects are quite common in crystals and are responsible for a number of properties like ionic conductivity, electronic properties of indirect semiconductors etc. In diffraction, defects ma...

How can nanoparticles or thin films be characterized using scattering methods? These and other questions were answered in the 5th CENEM Summer School for X-ray Scattering which took place from 29th July to 1st August 2019 at the Institute for Crystallography and Structural Physics (ICSP) in Erlan...